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The DELPHI Silicon Tracker in the global pattern recognition

ALEPH and DELPHI were the first experiments operating a silicon vertex detector at LEP. During the past 10 years of data taking the DELPHI Silicon Tracker was upgraded three times to follow the different tracking requirements for LEP 1 and LEP 2 as well as to improve the tracking performance. Severa...

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Detalles Bibliográficos
Autor principal: Elsing, Markus
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(00)00175-3
http://cds.cern.ch/record/424976
Descripción
Sumario:ALEPH and DELPHI were the first experiments operating a silicon vertex detector at LEP. During the past 10 years of data taking the DELPHI Silicon Tracker was upgraded three times to follow the different tracking requirements for LEP 1 and LEP 2 as well as to improve the tracking performance. Several steps in the development of the pattern recognition software were done in order to understand and fully exploit the silicon tracker information. This article gives an overview of the final algorithms and concepts of the track reconstruction using the Silicon Tracker in DELPHI.