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Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
CERN
1999
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-1999-009.51 http://cds.cern.ch/record/430575 |
| _version_ | 1780895229438590976 |
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| author | Schneider, B |
| author_facet | Schneider, B |
| author_sort | Schneider, B |
| collection | CERN |
| id | cern-430575 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1999 |
| publisher | CERN |
| record_format | invenio |
| spelling | cern-4305752019-09-30T06:29:59Zdoi:10.5170/CERN-1999-009.51http://cds.cern.ch/record/430575engSchneider, BScalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering testDetectors and Experimental TechniquesCERNoai:cds.cern.ch:4305751999 |
| spellingShingle | Detectors and Experimental Techniques Schneider, B Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test |
| title | Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test |
| title_full | Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test |
| title_fullStr | Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test |
| title_full_unstemmed | Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test |
| title_short | Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test |
| title_sort | scalable test solutions: a means of improving asic performance and time-to-market in mixed-signal engineering test |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.5170/CERN-1999-009.51 http://cds.cern.ch/record/430575 |
| work_keys_str_mv | AT schneiderb scalabletestsolutionsameansofimprovingasicperformanceandtimetomarketinmixedsignalengineeringtest |