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Scalable test solutions: a means of improving ASIC performance and time-to-market in mixed-signal engineering test

Detalles Bibliográficos
Autor principal:	Schneider, B
Lenguaje:	eng
Publicado:	CERN 1999
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-1999-009.51 http://cds.cern.ch/record/430575

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