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Comparative study of <111> and <100> crystals and capacitance measurements on Si strip detectors in CMS
For the construction of the silicon microstrip detectors for the tracker of the CMS experiment, two different substrate choices were investigated: A high-resistivity (6 k Omega cm) substrate with <111> crystal orientation and a low-resistivity (2 k Omega cm) one with <100> crystal orient...
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Lenguaje: | eng |
Publicado: |
1999
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/BF03185592 http://cds.cern.ch/record/430796 |
Sumario: | For the construction of the silicon microstrip detectors for the tracker of the CMS experiment, two different substrate choices were investigated: A high-resistivity (6 k Omega cm) substrate with <111> crystal orientation and a low-resistivity (2 k Omega cm) one with <100> crystal orientation. The interstrip and backplane capacitances were measured before and after the exposure to radiation in a range of strip pitches from 60 mu m to 240 mu m and for values of the width-over-pitch ratio between 0.1 and 0.5. (3 refs). |
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