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Wafer screening of the front-end ASICs for ATLAS SCT

Detalles Bibliográficos
Autores principales: Lacasta, C, Kaplon, J
Lenguaje:eng
Publicado: CERN 1999
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-1999-009.133
http://cds.cern.ch/record/432207
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author Lacasta, C
Kaplon, J
author_facet Lacasta, C
Kaplon, J
author_sort Lacasta, C
collection CERN
id cern-432207
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1999
publisher CERN
record_format invenio
spelling cern-4322072019-09-30T06:29:59Zdoi:10.5170/CERN-1999-009.133http://cds.cern.ch/record/432207engLacasta, CKaplon, JWafer screening of the front-end ASICs for ATLAS SCTDetectors and Experimental TechniquesCERNoai:cds.cern.ch:4322071999
spellingShingle Detectors and Experimental Techniques
Lacasta, C
Kaplon, J
Wafer screening of the front-end ASICs for ATLAS SCT
title Wafer screening of the front-end ASICs for ATLAS SCT
title_full Wafer screening of the front-end ASICs for ATLAS SCT
title_fullStr Wafer screening of the front-end ASICs for ATLAS SCT
title_full_unstemmed Wafer screening of the front-end ASICs for ATLAS SCT
title_short Wafer screening of the front-end ASICs for ATLAS SCT
title_sort wafer screening of the front-end asics for atlas sct
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-1999-009.133
http://cds.cern.ch/record/432207
work_keys_str_mv AT lacastac waferscreeningofthefrontendasicsforatlassct
AT kaplonj waferscreeningofthefrontendasicsforatlassct