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Wafer screening of the front-end ASICs for ATLAS SCT

Detalles Bibliográficos
Autores principales:	Lacasta, C, Kaplon, J
Lenguaje:	eng
Publicado:	CERN 1999
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-1999-009.133 http://cds.cern.ch/record/432207

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