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Near field optics and nanoscopy
This book contains the most recent information on optical nanoscopy. Far-Field and Near-Field properties on e.m. waves are presented which illustrate how optical images can be obtained from sub-micron objects. Scanning Probe techniques and computer processing are covered here. An explanation is give...
Autor principal: | Fillard, J P |
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Lenguaje: | eng |
Publicado: |
World Scientific
1996
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/432376 |
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