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Single event upset studies on the APV6 front end readout chip
Autores principales: | , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
CERN
1999
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.5170/CERN-1999-009.513 http://cds.cern.ch/record/436920 |
_version_ | 1780895460047716352 |
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author | Fulcher, J R Hall, G Raymond, M Bisello, D Paccagnella, A Stavitski, I Wyss, J Kaminski, A French, M Jones, L |
author_facet | Fulcher, J R Hall, G Raymond, M Bisello, D Paccagnella, A Stavitski, I Wyss, J Kaminski, A French, M Jones, L |
author_sort | Fulcher, J R |
collection | CERN |
id | cern-436920 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1999 |
publisher | CERN |
record_format | invenio |
spelling | cern-4369202019-09-30T06:29:59Zdoi:10.5170/CERN-1999-009.513http://cds.cern.ch/record/436920engFulcher, J RHall, GRaymond, MBisello, DPaccagnella, AStavitski, IWyss, JKaminski, AFrench, MJones, LSingle event upset studies on the APV6 front end readout chipDetectors and Experimental TechniquesCERNCERN-OPEN-2000-112oai:cds.cern.ch:4369201999-10-29 |
spellingShingle | Detectors and Experimental Techniques Fulcher, J R Hall, G Raymond, M Bisello, D Paccagnella, A Stavitski, I Wyss, J Kaminski, A French, M Jones, L Single event upset studies on the APV6 front end readout chip |
title | Single event upset studies on the APV6 front end readout chip |
title_full | Single event upset studies on the APV6 front end readout chip |
title_fullStr | Single event upset studies on the APV6 front end readout chip |
title_full_unstemmed | Single event upset studies on the APV6 front end readout chip |
title_short | Single event upset studies on the APV6 front end readout chip |
title_sort | single event upset studies on the apv6 front end readout chip |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.5170/CERN-1999-009.513 http://cds.cern.ch/record/436920 |
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