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Single event upset studies on the APV6 front end readout chip

Detalles Bibliográficos
Autores principales:	Fulcher, J R, Hall, G, Raymond, M, Bisello, D, Paccagnella, A, Stavitski, I, Wyss, J, Kaminski, A, French, M, Jones, L
Lenguaje:	eng
Publicado:	CERN 1999
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-1999-009.513 http://cds.cern.ch/record/436920

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