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International Workshop on Defect Engineering of Advanced Semiconductor Devices

Detalles Bibliográficos
Autor principal: Collective
Lenguaje:eng
Publicado: [s.n.] 2000
Materias:
Acceso en línea:http://cds.cern.ch/record/445225
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author Collective
author_facet Collective
author_sort Collective
collection CERN
id cern-445225
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
publisher [s.n.]
record_format invenio
spelling cern-4452252021-04-25T17:48:13Z http://cds.cern.ch/record/445225 eng Collective International Workshop on Defect Engineering of Advanced Semiconductor Devices Engineering [s.n.] 2000
spellingShingle Engineering
Collective
International Workshop on Defect Engineering of Advanced Semiconductor Devices
title International Workshop on Defect Engineering of Advanced Semiconductor Devices
title_full International Workshop on Defect Engineering of Advanced Semiconductor Devices
title_fullStr International Workshop on Defect Engineering of Advanced Semiconductor Devices
title_full_unstemmed International Workshop on Defect Engineering of Advanced Semiconductor Devices
title_short International Workshop on Defect Engineering of Advanced Semiconductor Devices
title_sort international workshop on defect engineering of advanced semiconductor devices
topic Engineering
url http://cds.cern.ch/record/445225
work_keys_str_mv AT collective internationalworkshopondefectengineeringofadvancedsemiconductordevices