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Photoelectron backscattering from silicon anodes of hybrid photodetector tubes

The impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient mu , the average number of photoelectrons N/sub phel/ emitted from the photocathode, and on the distribution...

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Detalles Bibliográficos
Autores principales: D'Ambrosio, C, Leutz, H
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1109/23.870861
http://cds.cern.ch/record/471526
Descripción
Sumario:The impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient mu , the average number of photoelectrons N/sub phel/ emitted from the photocathode, and on the distribution of the fractional photoelectron energy q absorbed in silicon during the backscattering process. We obtained the following results: the average number of absorbed (measured) photoelectrons N/sub meas/ in the silicon anode amounts to ~88% of the incident N/sub phel/. Photoelectron- and gamma-absorption peaks are broadened by a factor 1.043 due to backscattering. As an example, for photomultiplier tubes, this broadening can amount to an average factor of 1.18 due to statistic and gain fluctuations on the dynode chain. (15 refs).