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Photoelectron backscattering from silicon anodes of hybrid photodetector tubes

The impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient mu , the average number of photoelectrons N/sub phel/ emitted from the photocathode, and on the distribution...

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Detalles Bibliográficos
Autores principales: D'Ambrosio, C, Leutz, H
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1109/23.870861
http://cds.cern.ch/record/471526
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author D'Ambrosio, C
Leutz, H
author_facet D'Ambrosio, C
Leutz, H
author_sort D'Ambrosio, C
collection CERN
description The impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient mu , the average number of photoelectrons N/sub phel/ emitted from the photocathode, and on the distribution of the fractional photoelectron energy q absorbed in silicon during the backscattering process. We obtained the following results: the average number of absorbed (measured) photoelectrons N/sub meas/ in the silicon anode amounts to ~88% of the incident N/sub phel/. Photoelectron- and gamma-absorption peaks are broadened by a factor 1.043 due to backscattering. As an example, for photomultiplier tubes, this broadening can amount to an average factor of 1.18 due to statistic and gain fluctuations on the dynode chain. (15 refs).
id cern-471526
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
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spelling cern-4715262019-09-30T06:29:59Zdoi:10.1109/23.870861http://cds.cern.ch/record/471526engD'Ambrosio, CLeutz, HPhotoelectron backscattering from silicon anodes of hybrid photodetector tubesDetectors and Experimental TechniquesThe impact of photoelectron backscattering on spectral distributions measured with hybrid photodetector tubes has been calculated. The calculations are based on the backscattering coefficient mu , the average number of photoelectrons N/sub phel/ emitted from the photocathode, and on the distribution of the fractional photoelectron energy q absorbed in silicon during the backscattering process. We obtained the following results: the average number of absorbed (measured) photoelectrons N/sub meas/ in the silicon anode amounts to ~88% of the incident N/sub phel/. Photoelectron- and gamma-absorption peaks are broadened by a factor 1.043 due to backscattering. As an example, for photomultiplier tubes, this broadening can amount to an average factor of 1.18 due to statistic and gain fluctuations on the dynode chain. (15 refs).oai:cds.cern.ch:4715262000
spellingShingle Detectors and Experimental Techniques
D'Ambrosio, C
Leutz, H
Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
title Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
title_full Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
title_fullStr Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
title_full_unstemmed Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
title_short Photoelectron backscattering from silicon anodes of hybrid photodetector tubes
title_sort photoelectron backscattering from silicon anodes of hybrid photodetector tubes
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/23.870861
http://cds.cern.ch/record/471526
work_keys_str_mv AT dambrosioc photoelectronbackscatteringfromsiliconanodesofhybridphotodetectortubes
AT leutzh photoelectronbackscatteringfromsiliconanodesofhybridphotodetectortubes