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Neutron hardness testing of electronic components for the LHC
The facility at Minnesota will be used primarily to test electronics components for the CMS crystal calorimeter. We will use two sources of /sup 252/Cf. In the design of our electronics, we are using processes that are known to be radiation hard at our levels. We are using the Intersil UHF1x, and th...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
2000
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/471538 |
Sumario: | The facility at Minnesota will be used primarily to test electronics components for the CMS crystal calorimeter. We will use two sources of /sup 252/Cf. In the design of our electronics, we are using processes that are known to be radiation hard at our levels. We are using the Intersil UHF1x, and the Honeywell GaAs CHFET process and custom-designed avalanche photodiodes from Hamatasu Photonics. Nevertheless, to ensure that the radiation tolerance is maintained during production, we need to continuously monitor the performance of the components as they are manufactured. (0 refs). |
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