Neutron hardness testing of electronic components for the LHC

The facility at Minnesota will be used primarily to test electronics components for the CMS crystal calorimeter. We will use two sources of /sup 252/Cf. In the design of our electronics, we are using processes that are known to be radiation hard at our levels. We are using the Intersil UHF1x, and th...

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Detalles Bibliográficos
Autores principales: Broadhurst, J H, Rusaick, R
Lenguaje:eng
Publicado: 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/471538
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author Broadhurst, J H
Rusaick, R
author_facet Broadhurst, J H
Rusaick, R
author_sort Broadhurst, J H
collection CERN
description The facility at Minnesota will be used primarily to test electronics components for the CMS crystal calorimeter. We will use two sources of /sup 252/Cf. In the design of our electronics, we are using processes that are known to be radiation hard at our levels. We are using the Intersil UHF1x, and the Honeywell GaAs CHFET process and custom-designed avalanche photodiodes from Hamatasu Photonics. Nevertheless, to ensure that the radiation tolerance is maintained during production, we need to continuously monitor the performance of the components as they are manufactured. (0 refs).
id cern-471538
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
record_format invenio
spelling cern-4715382019-09-30T06:29:59Zhttp://cds.cern.ch/record/471538engBroadhurst, J HRusaick, RNeutron hardness testing of electronic components for the LHCDetectors and Experimental TechniquesThe facility at Minnesota will be used primarily to test electronics components for the CMS crystal calorimeter. We will use two sources of /sup 252/Cf. In the design of our electronics, we are using processes that are known to be radiation hard at our levels. We are using the Intersil UHF1x, and the Honeywell GaAs CHFET process and custom-designed avalanche photodiodes from Hamatasu Photonics. Nevertheless, to ensure that the radiation tolerance is maintained during production, we need to continuously monitor the performance of the components as they are manufactured. (0 refs).oai:cds.cern.ch:4715382000
spellingShingle Detectors and Experimental Techniques
Broadhurst, J H
Rusaick, R
Neutron hardness testing of electronic components for the LHC
title Neutron hardness testing of electronic components for the LHC
title_full Neutron hardness testing of electronic components for the LHC
title_fullStr Neutron hardness testing of electronic components for the LHC
title_full_unstemmed Neutron hardness testing of electronic components for the LHC
title_short Neutron hardness testing of electronic components for the LHC
title_sort neutron hardness testing of electronic components for the lhc
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/471538
work_keys_str_mv AT broadhurstjh neutronhardnesstestingofelectroniccomponentsforthelhc
AT rusaickr neutronhardnesstestingofelectroniccomponentsforthelhc

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