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OT Test-beam data analysis

Detalles Bibliográficos
Autores principales:	Van der Eijk, R, Needham, M D, Van der Kuur, J, Renner, K L W
Lenguaje:	eng
Publicado:	1999
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/472388

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