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Comparative accuracy study of current-mode versus voltage mode analog memory in 0.25 $\mu m$ technology

Detalles Bibliográficos
Autores principales:	Michel, J, Vautrin, F, Braun, F
Lenguaje:	eng
Publicado:	CERN 2000
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-2000-010.530 http://cds.cern.ch/record/479727

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