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Analysis of Shielding Charged Particle Beams by thin Conductors

We present an analysis of shielding of electromagnetic fields excited by beams of charged particles surrounded by thin conducting layers or metal stripes inside an external structure of finite length. The ability of shielding by a layer thinner than the skin depth is explained and expressions for th...

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Detalles Bibliográficos
Autores principales: Gluckstern, R L, Zotter, Bruno W
Lenguaje:eng
Publicado: 2001
Materias:
Acceso en línea:http://cds.cern.ch/record/488448
Descripción
Sumario:We present an analysis of shielding of electromagnetic fields excited by beams of charged particles surrounded by thin conducting layers or metal stripes inside an external structure of finite length. The ability of shielding by a layer thinner than the skin depth is explained and expressions for the impedance are derived. A previous result[1] showing preferential penetration through the shielding layer at the resonant frequencies of the surrounding structure is verified, and extended to include finite resistivity of the outer structure. Integration over the spectrum of the beam bunch shows that penetration is (nearly) independent of the quality factors of the resonances. The transition of these results to those for a geometry of infinite length requires numerical evaluation.