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Radiation damage studies of silicon microstrip sensors

Various types of large area silicon microstrip detectors were fabricated for the development of radiation-tolerant detectors that will operate in the LHC ATLAS SCT. The detectors were irradiated with 12-GeV protons at KEK to fluences of 1.7*10/sup 14/ and 4.2*10/sup 14 / protons/cm/sup 2/. Irradiate...

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Detalles Bibliográficos
Autores principales: Nakayama, T, Arai, S, Hara, K, Shimojima, M, Ikegami, Y, Iwata, Y, Johansen, L G, Kobayashi, H, Kohriki, T, Kondo, T, Nakano, I, Ohsugi, T, Riedler, P, Roe, S, Stapnes, Steinar, Stugu, B, Takashima, R, Tanizaki, K, Terada, S, Unno, Y, Yamamoto, K, Yamamura, K
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1109/23.914464
http://cds.cern.ch/record/503595
Descripción
Sumario:Various types of large area silicon microstrip detectors were fabricated for the development of radiation-tolerant detectors that will operate in the LHC ATLAS SCT. The detectors were irradiated with 12-GeV protons at KEK to fluences of 1.7*10/sup 14/ and 4.2*10/sup 14 / protons/cm/sup 2/. Irradiated samples included n-on-n detectors with 4 k Omega cm bulk resistivity and p-on-n detectors with 1 k Omega cm and 4 k Omega cm bulk resistivities. Four patterns of p-stop structures are configured in the n-on-n detectors. Although Hamamatsu fabricated most of the detectors, p-on-n detectors by SINTEF are also included, as well as those fabricated in a modified process by Hamamatsu. The detector performances after irradiation that are compared are the probability of creation of faulty coupling capacitors, C-V characteristics, charge curves, and total leakage current. The p-on-n are similar to the n-on-n detectors in these performances, and will remain operational in the ATLAS radiation environment. (12 refs).