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Radiation damage studies of silicon microstrip sensors

Various types of large area silicon microstrip detectors were fabricated for the development of radiation-tolerant detectors that will operate in the LHC ATLAS SCT. The detectors were irradiated with 12-GeV protons at KEK to fluences of 1.7*10/sup 14/ and 4.2*10/sup 14 / protons/cm/sup 2/. Irradiate...

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Autores principales: Nakayama, T, Arai, S, Hara, K, Shimojima, M, Ikegami, Y, Iwata, Y, Johansen, L G, Kobayashi, H, Kohriki, T, Kondo, T, Nakano, I, Ohsugi, T, Riedler, P, Roe, S, Stapnes, Steinar, Stugu, B, Takashima, R, Tanizaki, K, Terada, S, Unno, Y, Yamamoto, K, Yamamura, K
Lenguaje:eng
Publicado: 2000
Materias:
Acceso en línea:https://dx.doi.org/10.1109/23.914464
http://cds.cern.ch/record/503595
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author Nakayama, T
Arai, S
Hara, K
Shimojima, M
Ikegami, Y
Iwata, Y
Johansen, L G
Kobayashi, H
Kohriki, T
Kondo, T
Nakano, I
Ohsugi, T
Riedler, P
Roe, S
Stapnes, Steinar
Stugu, B
Takashima, R
Tanizaki, K
Terada, S
Unno, Y
Yamamoto, K
Yamamura, K
author_facet Nakayama, T
Arai, S
Hara, K
Shimojima, M
Ikegami, Y
Iwata, Y
Johansen, L G
Kobayashi, H
Kohriki, T
Kondo, T
Nakano, I
Ohsugi, T
Riedler, P
Roe, S
Stapnes, Steinar
Stugu, B
Takashima, R
Tanizaki, K
Terada, S
Unno, Y
Yamamoto, K
Yamamura, K
author_sort Nakayama, T
collection CERN
description Various types of large area silicon microstrip detectors were fabricated for the development of radiation-tolerant detectors that will operate in the LHC ATLAS SCT. The detectors were irradiated with 12-GeV protons at KEK to fluences of 1.7*10/sup 14/ and 4.2*10/sup 14 / protons/cm/sup 2/. Irradiated samples included n-on-n detectors with 4 k Omega cm bulk resistivity and p-on-n detectors with 1 k Omega cm and 4 k Omega cm bulk resistivities. Four patterns of p-stop structures are configured in the n-on-n detectors. Although Hamamatsu fabricated most of the detectors, p-on-n detectors by SINTEF are also included, as well as those fabricated in a modified process by Hamamatsu. The detector performances after irradiation that are compared are the probability of creation of faulty coupling capacitors, C-V characteristics, charge curves, and total leakage current. The p-on-n are similar to the n-on-n detectors in these performances, and will remain operational in the ATLAS radiation environment. (12 refs).
id cern-503595
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
record_format invenio
spelling cern-5035952019-09-30T06:29:59Zdoi:10.1109/23.914464http://cds.cern.ch/record/503595engNakayama, TArai, SHara, KShimojima, MIkegami, YIwata, YJohansen, L GKobayashi, HKohriki, TKondo, TNakano, IOhsugi, TRiedler, PRoe, SStapnes, SteinarStugu, BTakashima, RTanizaki, KTerada, SUnno, YYamamoto, KYamamura, KRadiation damage studies of silicon microstrip sensorsDetectors and Experimental TechniquesVarious types of large area silicon microstrip detectors were fabricated for the development of radiation-tolerant detectors that will operate in the LHC ATLAS SCT. The detectors were irradiated with 12-GeV protons at KEK to fluences of 1.7*10/sup 14/ and 4.2*10/sup 14 / protons/cm/sup 2/. Irradiated samples included n-on-n detectors with 4 k Omega cm bulk resistivity and p-on-n detectors with 1 k Omega cm and 4 k Omega cm bulk resistivities. Four patterns of p-stop structures are configured in the n-on-n detectors. Although Hamamatsu fabricated most of the detectors, p-on-n detectors by SINTEF are also included, as well as those fabricated in a modified process by Hamamatsu. The detector performances after irradiation that are compared are the probability of creation of faulty coupling capacitors, C-V characteristics, charge curves, and total leakage current. The p-on-n are similar to the n-on-n detectors in these performances, and will remain operational in the ATLAS radiation environment. (12 refs).oai:cds.cern.ch:5035952000
spellingShingle Detectors and Experimental Techniques
Nakayama, T
Arai, S
Hara, K
Shimojima, M
Ikegami, Y
Iwata, Y
Johansen, L G
Kobayashi, H
Kohriki, T
Kondo, T
Nakano, I
Ohsugi, T
Riedler, P
Roe, S
Stapnes, Steinar
Stugu, B
Takashima, R
Tanizaki, K
Terada, S
Unno, Y
Yamamoto, K
Yamamura, K
Radiation damage studies of silicon microstrip sensors
title Radiation damage studies of silicon microstrip sensors
title_full Radiation damage studies of silicon microstrip sensors
title_fullStr Radiation damage studies of silicon microstrip sensors
title_full_unstemmed Radiation damage studies of silicon microstrip sensors
title_short Radiation damage studies of silicon microstrip sensors
title_sort radiation damage studies of silicon microstrip sensors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/23.914464
http://cds.cern.ch/record/503595
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