Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker

Studies have been performed on the effects of radiation on ASICs incorporating bipolar npn transistors in the AMS 0.8 mu m BiCMOS process. Radiation effects are reviewed and the approach used to achieve radiation tolerant ASICs is described. The radiation tests required to validate the ASICs for use...

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Detalles Bibliográficos
Autores principales: White, D J, Dowell, John D, Mahout, G, Jovanovic, P, Mandic, I, Weidberg, A R
Lenguaje:eng
Publicado: 2001
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(00)00763-4
http://cds.cern.ch/record/503754
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author White, D J
Dowell, John D
Mahout, G
Jovanovic, P
Mandic, I
Weidberg, A R
author_facet White, D J
Dowell, John D
Mahout, G
Jovanovic, P
Mandic, I
Weidberg, A R
author_sort White, D J
collection CERN
description Studies have been performed on the effects of radiation on ASICs incorporating bipolar npn transistors in the AMS 0.8 mu m BiCMOS process. Radiation effects are reviewed and the approach used to achieve radiation tolerant ASICs is described. The radiation tests required to validate the ASICs for use in the ATLAS detector at the CERN Large Hadron Collider are discussed. The results demonstrate that they are sufficiently radiation tolerant for use in the ATLAS semiconductor tracker. (20 refs).
id cern-503754
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2001
record_format invenio
spelling cern-5037542019-09-30T06:29:59Zdoi:10.1016/S0168-9002(00)00763-4http://cds.cern.ch/record/503754engWhite, D JDowell, John DMahout, GJovanovic, PMandic, IWeidberg, A RRadiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor trackerDetectors and Experimental TechniquesStudies have been performed on the effects of radiation on ASICs incorporating bipolar npn transistors in the AMS 0.8 mu m BiCMOS process. Radiation effects are reviewed and the approach used to achieve radiation tolerant ASICs is described. The radiation tests required to validate the ASICs for use in the ATLAS detector at the CERN Large Hadron Collider are discussed. The results demonstrate that they are sufficiently radiation tolerant for use in the ATLAS semiconductor tracker. (20 refs).oai:cds.cern.ch:5037542001
spellingShingle Detectors and Experimental Techniques
White, D J
Dowell, John D
Mahout, G
Jovanovic, P
Mandic, I
Weidberg, A R
Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker
title Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker
title_full Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker
title_fullStr Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker
title_full_unstemmed Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker
title_short Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS semiconductor tracker
title_sort radiation hardness studies of the front-end asics for the optical links of the atlas semiconductor tracker
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(00)00763-4
http://cds.cern.ch/record/503754
work_keys_str_mv AT whitedj radiationhardnessstudiesofthefrontendasicsfortheopticallinksoftheatlassemiconductortracker
AT dowelljohnd radiationhardnessstudiesofthefrontendasicsfortheopticallinksoftheatlassemiconductortracker
AT mahoutg radiationhardnessstudiesofthefrontendasicsfortheopticallinksoftheatlassemiconductortracker
AT jovanovicp radiationhardnessstudiesofthefrontendasicsfortheopticallinksoftheatlassemiconductortracker
AT mandici radiationhardnessstudiesofthefrontendasicsfortheopticallinksoftheatlassemiconductortracker
AT weidbergar radiationhardnessstudiesofthefrontendasicsfortheopticallinksoftheatlassemiconductortracker

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