X-ray tomography for the ATLAS semiconductor tracker

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Results are presented of precision tests with the prototype of an X- ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 mu m in r phi and better than 30 mu m in r, where r and phi a...

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Detalles Bibliográficos
Autores principales: Doucas, G, Grosse-Knetter, J, Nickerson, R B, Vertogradov, L S
Lenguaje:eng
Publicado: 2001
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(00)00667-7
http://cds.cern.ch/record/503757
_version_ 1780897304613486592
author Doucas, G
Grosse-Knetter, J
Nickerson, R B
Vertogradov, L S
author_facet Doucas, G
Grosse-Knetter, J
Nickerson, R B
Vertogradov, L S
author_sort Doucas, G
collection CERN
description Results are presented of precision tests with the prototype of an X- ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 mu m in r phi and better than 30 mu m in r, where r and phi are polar coordinates, and are sufficient for a high-precision survey of the barrels of the ATLAS semiconductor tracker. (8 refs).
id cern-503757
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2001
record_format invenio
spelling cern-5037572019-09-30T06:29:59Zdoi:10.1016/S0168-9002(00)00667-7http://cds.cern.ch/record/503757engDoucas, GGrosse-Knetter, JNickerson, R BVertogradov, L SX-ray tomography for the ATLAS semiconductor trackerDetectors and Experimental TechniquesResults are presented of precision tests with the prototype of an X- ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 mu m in r phi and better than 30 mu m in r, where r and phi are polar coordinates, and are sufficient for a high-precision survey of the barrels of the ATLAS semiconductor tracker. (8 refs).oai:cds.cern.ch:5037572001
spellingShingle Detectors and Experimental Techniques
Doucas, G
Grosse-Knetter, J
Nickerson, R B
Vertogradov, L S
X-ray tomography for the ATLAS semiconductor tracker
title X-ray tomography for the ATLAS semiconductor tracker
title_full X-ray tomography for the ATLAS semiconductor tracker
title_fullStr X-ray tomography for the ATLAS semiconductor tracker
title_full_unstemmed X-ray tomography for the ATLAS semiconductor tracker
title_short X-ray tomography for the ATLAS semiconductor tracker
title_sort x-ray tomography for the atlas semiconductor tracker
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(00)00667-7
http://cds.cern.ch/record/503757
work_keys_str_mv AT doucasg xraytomographyfortheatlassemiconductortracker
AT grosseknetterj xraytomographyfortheatlassemiconductortracker
AT nickersonrb xraytomographyfortheatlassemiconductortracker
AT vertogradovls xraytomographyfortheatlassemiconductortracker

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