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X-ray tomography for the ATLAS semiconductor tracker
Results are presented of precision tests with the prototype of an X- ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 mu m in r phi and better than 30 mu m in r, where r and phi a...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2001
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(00)00667-7 http://cds.cern.ch/record/503757 |
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