Fluxon-induced losses in niobium thin-film cavities

New data obtained with niobium film cavities allow a refinement of the physical explanation of RF losses by trapped magnetic flux at small RF field amplitudes. A stationary model explains these data. As the diameter of the fluxons decreases, the RF bypasses them, and the RF losses are due to the vol...

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Detalles Bibliográficos
Autor principal: Weingarten, Wolfgang
Lenguaje:eng
Publicado: 2000
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1016/S0921-4534(00)00365-8
http://cds.cern.ch/record/504164
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author Weingarten, Wolfgang
author_facet Weingarten, Wolfgang
author_sort Weingarten, Wolfgang
collection CERN
description New data obtained with niobium film cavities allow a refinement of the physical explanation of RF losses by trapped magnetic flux at small RF field amplitudes. A stationary model explains these data. As the diameter of the fluxons decreases, the RF bypasses them, and the RF losses are due to the voltage, to which the normal conducting electrons, located in the fluxon core, are subject to. This loss mechanism is similar in origin to that of the so-called BCS losses. (13 refs).
id cern-504164
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
record_format invenio
spelling cern-5041642019-09-30T06:29:59Zdoi:10.1016/S0921-4534(00)00365-8http://cds.cern.ch/record/504164engWeingarten, WolfgangFluxon-induced losses in niobium thin-film cavitiesEngineeringNew data obtained with niobium film cavities allow a refinement of the physical explanation of RF losses by trapped magnetic flux at small RF field amplitudes. A stationary model explains these data. As the diameter of the fluxons decreases, the RF bypasses them, and the RF losses are due to the voltage, to which the normal conducting electrons, located in the fluxon core, are subject to. This loss mechanism is similar in origin to that of the so-called BCS losses. (13 refs).oai:cds.cern.ch:5041642000
spellingShingle Engineering
Weingarten, Wolfgang
Fluxon-induced losses in niobium thin-film cavities
title Fluxon-induced losses in niobium thin-film cavities
title_full Fluxon-induced losses in niobium thin-film cavities
title_fullStr Fluxon-induced losses in niobium thin-film cavities
title_full_unstemmed Fluxon-induced losses in niobium thin-film cavities
title_short Fluxon-induced losses in niobium thin-film cavities
title_sort fluxon-induced losses in niobium thin-film cavities
topic Engineering
url https://dx.doi.org/10.1016/S0921-4534(00)00365-8
http://cds.cern.ch/record/504164
work_keys_str_mv AT weingartenwolfgang fluxoninducedlossesinniobiumthinfilmcavities

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