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Fluxon-induced losses in niobium thin-film cavities
New data obtained with niobium film cavities allow a refinement of the physical explanation of RF losses by trapped magnetic flux at small RF field amplitudes. A stationary model explains these data. As the diameter of the fluxons decreases, the RF bypasses them, and the RF losses are due to the vol...
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| Lenguaje: | eng |
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2000
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| Acceso en línea: | https://dx.doi.org/10.1016/S0921-4534(00)00365-8 http://cds.cern.ch/record/504164 |