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Silicon pixel capacitance

Capacitance measurements have been made on silicon pixel sensors of types n/sup +/-on-n, p/sup +/-on-n, and n/sup +/-on-p. The arrays test a variety of implant and gap widths, and the n/sup +/-on-n devices test several p-stop designs. The measurements examine inter- pixel and backplane contributions...

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Detalles Bibliográficos
Autores principales: Gorfine, G W, Hoeferkamp, M, Santistevan, G, Seidel, S
Lenguaje:eng
Publicado: 2001
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(01)00348-5
http://cds.cern.ch/record/516881
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author Gorfine, G W
Hoeferkamp, M
Santistevan, G
Seidel, S
author_facet Gorfine, G W
Hoeferkamp, M
Santistevan, G
Seidel, S
author_sort Gorfine, G W
collection CERN
description Capacitance measurements have been made on silicon pixel sensors of types n/sup +/-on-n, p/sup +/-on-n, and n/sup +/-on-p. The arrays test a variety of implant and gap widths, and the n/sup +/-on-n devices test several p-stop designs. The measurements examine inter- pixel and backplane contributions and include studies of temperature dependence. Measurements were made before and after irradiation with fluences relevant to LHC experiments and Fermilab Tevatron Run 2. (6 refs).
id cern-516881
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2001
record_format invenio
spelling cern-5168812019-09-30T06:29:59Zdoi:10.1016/S0168-9002(01)00348-5http://cds.cern.ch/record/516881engGorfine, G WHoeferkamp, MSantistevan, GSeidel, SSilicon pixel capacitanceDetectors and Experimental TechniquesCapacitance measurements have been made on silicon pixel sensors of types n/sup +/-on-n, p/sup +/-on-n, and n/sup +/-on-p. The arrays test a variety of implant and gap widths, and the n/sup +/-on-n devices test several p-stop designs. The measurements examine inter- pixel and backplane contributions and include studies of temperature dependence. Measurements were made before and after irradiation with fluences relevant to LHC experiments and Fermilab Tevatron Run 2. (6 refs).oai:cds.cern.ch:5168812001
spellingShingle Detectors and Experimental Techniques
Gorfine, G W
Hoeferkamp, M
Santistevan, G
Seidel, S
Silicon pixel capacitance
title Silicon pixel capacitance
title_full Silicon pixel capacitance
title_fullStr Silicon pixel capacitance
title_full_unstemmed Silicon pixel capacitance
title_short Silicon pixel capacitance
title_sort silicon pixel capacitance
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(01)00348-5
http://cds.cern.ch/record/516881
work_keys_str_mv AT gorfinegw siliconpixelcapacitance
AT hoeferkampm siliconpixelcapacitance
AT santistevang siliconpixelcapacitance
AT seidels siliconpixelcapacitance