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Silicon pixel capacitance
Capacitance measurements have been made on silicon pixel sensors of types n/sup +/-on-n, p/sup +/-on-n, and n/sup +/-on-p. The arrays test a variety of implant and gap widths, and the n/sup +/-on-n devices test several p-stop designs. The measurements examine inter- pixel and backplane contributions...
Autores principales: | Gorfine, G W, Hoeferkamp, M, Santistevan, G, Seidel, S |
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Lenguaje: | eng |
Publicado: |
2001
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(01)00348-5 http://cds.cern.ch/record/516881 |
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