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Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
ASTM
2007
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/522447 |
| _version_ | 1780897826978398208 |
|---|---|
| author | American Society for Testing and Materials. Philadelphia |
| author_facet | American Society for Testing and Materials. Philadelphia |
| author_sort | American Society for Testing and Materials. Philadelphia |
| collection | CERN |
| id | cern-522447 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2007 |
| publisher | ASTM |
| record_format | invenio |
| spelling | cern-5224472021-04-23T00:38:32Zhttp://cds.cern.ch/record/522447engAmerican Society for Testing and Materials. PhiladelphiaStandard Guide to Interpretation of Radiographs of Semiconductors and Related DevicesEngineeringASTMoai:cds.cern.ch:5224472007 |
| spellingShingle | Engineering American Society for Testing and Materials. Philadelphia Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| title | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| title_full | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| title_fullStr | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| title_full_unstemmed | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| title_short | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| title_sort | standard guide to interpretation of radiographs of semiconductors and related devices |
| topic | Engineering |
| url | http://cds.cern.ch/record/522447 |
| work_keys_str_mv | AT americansocietyfortestingandmaterialsphiladelphia standardguidetointerpretationofradiographsofsemiconductorsandrelateddevices |