Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems

Detalles Bibliográficos
Autor principal: American Society for Testing and Materials. Philadelphia
Lenguaje:eng
Publicado: ASTM 2010
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/522524
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author American Society for Testing and Materials. Philadelphia
author_facet American Society for Testing and Materials. Philadelphia
author_sort American Society for Testing and Materials. Philadelphia
collection CERN
id cern-522524
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2010
publisher ASTM
record_format invenio
spelling cern-5225242021-04-23T00:37:41Zhttp://cds.cern.ch/record/522524engAmerican Society for Testing and Materials. PhiladelphiaStandard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging SystemsEngineeringASTMoai:cds.cern.ch:5225242010
spellingShingle Engineering
American Society for Testing and Materials. Philadelphia
Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems
title Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems
title_full Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems
title_fullStr Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems
title_full_unstemmed Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems
title_short Standard Test Method for Minimum Detectable Temperature Difference for Thermal Imaging Systems
title_sort standard test method for minimum detectable temperature difference for thermal imaging systems
topic Engineering
url http://cds.cern.ch/record/522524
work_keys_str_mv AT americansocietyfortestingandmaterialsphiladelphia standardtestmethodforminimumdetectabletemperaturedifferenceforthermalimagingsystems

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