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Single Event Upset tests of commercial FPGA for space applications
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
CERN
2001
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2001-005.32 http://cds.cern.ch/record/528419 |
| _version_ | 1780897956128358400 |
|---|---|
| author | Mattsson, S |
| author_facet | Mattsson, S |
| author_sort | Mattsson, S |
| collection | CERN |
| id | cern-528419 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2001 |
| publisher | CERN |
| record_format | invenio |
| spelling | cern-5284192019-09-30T06:29:59Zdoi:10.5170/CERN-2001-005.32http://cds.cern.ch/record/528419engMattsson, SSingle Event Upset tests of commercial FPGA for space applicationsDetectors and Experimental TechniquesCERNoai:cds.cern.ch:5284192001 |
| spellingShingle | Detectors and Experimental Techniques Mattsson, S Single Event Upset tests of commercial FPGA for space applications |
| title | Single Event Upset tests of commercial FPGA for space applications |
| title_full | Single Event Upset tests of commercial FPGA for space applications |
| title_fullStr | Single Event Upset tests of commercial FPGA for space applications |
| title_full_unstemmed | Single Event Upset tests of commercial FPGA for space applications |
| title_short | Single Event Upset tests of commercial FPGA for space applications |
| title_sort | single event upset tests of commercial fpga for space applications |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.5170/CERN-2001-005.32 http://cds.cern.ch/record/528419 |
| work_keys_str_mv | AT mattssons singleeventupsettestsofcommercialfpgaforspaceapplications |