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Single Event Upset tests of commercial FPGA for space applications

Detalles Bibliográficos
Autor principal:	Mattsson, S
Lenguaje:	eng
Publicado:	CERN 2001
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-2001-005.32 http://cds.cern.ch/record/528419

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