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8th International Symposium on Electron Beam Ion Sources and Traps and their Applications

Detalles Bibliográficos
Autor principal: Prelec, K
Lenguaje:eng
Publicado: AIP 2000
Materias:
Acceso en línea:http://cds.cern.ch/record/535806
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author Prelec, K
author_facet Prelec, K
author_sort Prelec, K
collection CERN
id cern-535806
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
publisher AIP
record_format invenio
spelling cern-5358062021-07-30T13:22:09Z http://cds.cern.ch/record/535806 eng Prelec, K 8th International Symposium on Electron Beam Ion Sources and Traps and their Applications Other Fields of Physics AIP 2000
spellingShingle Other Fields of Physics
Prelec, K
8th International Symposium on Electron Beam Ion Sources and Traps and their Applications
title 8th International Symposium on Electron Beam Ion Sources and Traps and their Applications
title_full 8th International Symposium on Electron Beam Ion Sources and Traps and their Applications
title_fullStr 8th International Symposium on Electron Beam Ion Sources and Traps and their Applications
title_full_unstemmed 8th International Symposium on Electron Beam Ion Sources and Traps and their Applications
title_short 8th International Symposium on Electron Beam Ion Sources and Traps and their Applications
title_sort 8th international symposium on electron beam ion sources and traps and their applications
topic Other Fields of Physics
url http://cds.cern.ch/record/535806
work_keys_str_mv AT preleck 8thinternationalsymposiumonelectronbeamionsourcesandtrapsandtheirapplications