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21st International Conference on Defects in Semiconductors
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
2001
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/536347 |
_version_ | 1780898222346076160 |
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author | Hofmann, D M |
author_facet | Hofmann, D M |
author_sort | Hofmann, D M |
collection | CERN |
id | cern-536347 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2001 |
record_format | invenio |
spelling | cern-5363472021-07-30T13:20:31Z http://cds.cern.ch/record/536347 eng Hofmann, D M 21st International Conference on Defects in Semiconductors Condensed Matter 2001 |
spellingShingle | Condensed Matter Hofmann, D M 21st International Conference on Defects in Semiconductors |
title | 21st International Conference on Defects in Semiconductors |
title_full | 21st International Conference on Defects in Semiconductors |
title_fullStr | 21st International Conference on Defects in Semiconductors |
title_full_unstemmed | 21st International Conference on Defects in Semiconductors |
title_short | 21st International Conference on Defects in Semiconductors |
title_sort | 21st international conference on defects in semiconductors |
topic | Condensed Matter |
url | http://cds.cern.ch/record/536347 |
work_keys_str_mv | AT hofmanndm 21stinternationalconferenceondefectsinsemiconductors |