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Charge collection and field profile in heavily irradiated Si diodes
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Lenguaje: | eng |
Publicado: |
1998
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Acceso en línea: | http://cds.cern.ch/record/539867 |
_version_ | 1780898322761908224 |
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author | Chilingarov, A G |
author_facet | Chilingarov, A G |
author_sort | Chilingarov, A G |
collection | CERN |
id | cern-539867 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1998 |
record_format | invenio |
spelling | cern-5398672019-09-30T06:29:59Zhttp://cds.cern.ch/record/539867engChilingarov, A GCharge collection and field profile in heavily irradiated Si diodesDetectors and Experimental Techniquesoai:cds.cern.ch:5398671998 |
spellingShingle | Detectors and Experimental Techniques Chilingarov, A G Charge collection and field profile in heavily irradiated Si diodes |
title | Charge collection and field profile in heavily irradiated Si diodes |
title_full | Charge collection and field profile in heavily irradiated Si diodes |
title_fullStr | Charge collection and field profile in heavily irradiated Si diodes |
title_full_unstemmed | Charge collection and field profile in heavily irradiated Si diodes |
title_short | Charge collection and field profile in heavily irradiated Si diodes |
title_sort | charge collection and field profile in heavily irradiated si diodes |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/539867 |
work_keys_str_mv | AT chilingarovag chargecollectionandfieldprofileinheavilyirradiatedsidiodes |