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Surface and thin film analysis: principles, instrumentation, applications
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Wiley
2001
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/546232 |
| _version_ | 1780898421015576576 |
|---|---|
| author | Jenett, H Bubert, H |
| author_facet | Jenett, H Bubert, H |
| author_sort | Jenett, H |
| collection | CERN |
| id | cern-546232 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2001 |
| publisher | Wiley |
| record_format | invenio |
| spelling | cern-5462322021-04-22T02:47:43Zhttp://cds.cern.ch/record/546232engJenett, HBubert, HSurface and thin film analysis: principles, instrumentation, applicationsCondensed MatterWileyoai:cds.cern.ch:5462322001 |
| spellingShingle | Condensed Matter Jenett, H Bubert, H Surface and thin film analysis: principles, instrumentation, applications |
| title | Surface and thin film analysis: principles, instrumentation, applications |
| title_full | Surface and thin film analysis: principles, instrumentation, applications |
| title_fullStr | Surface and thin film analysis: principles, instrumentation, applications |
| title_full_unstemmed | Surface and thin film analysis: principles, instrumentation, applications |
| title_short | Surface and thin film analysis: principles, instrumentation, applications |
| title_sort | surface and thin film analysis: principles, instrumentation, applications |
| topic | Condensed Matter |
| url | http://cds.cern.ch/record/546232 |
| work_keys_str_mv | AT jenetth surfaceandthinfilmanalysisprinciplesinstrumentationapplications AT buberth surfaceandthinfilmanalysisprinciplesinstrumentationapplications |