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Laser Profile Measurements of an H- Beam

A non-intercepting beam profile monitor for H<sup><font size="-1">-</font></sup>-beams is being developed at Brookhaven National Lab. An H<sup><font size="-1">-</font></sup> ion has a first ionization potential of 0.75eV. Electrons...

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Detalles Bibliográficos
Autores principales: Connolly, R, Cameron, P, Cupolo, J, Grau, M, Kesselman, M, Liaw, C J, Sikora, R
Lenguaje:eng
Publicado: 2001
Materias:
Acceso en línea:http://cds.cern.ch/record/555946
Descripción
Sumario:A non-intercepting beam profile monitor for H<sup><font size="-1">-</font></sup>-beams is being developed at Brookhaven National Lab. An H<sup><font size="-1">-</font></sup> ion has a first ionization potential of 0.75eV. Electrons can be removed from an H<sup><font size="-1">-</font></sup>-beam by passing light from a near-infrared laser through it. Experiments have been performed on the BNL linac to measure the transverse profile of a 750keV beam by using a Nd:YAG laser to photoneutralize narrow slices of the beam. The laser beam is scanned across the ion beam neutralizing the portion of the beam struck by the laser. The electrons are removed from the ion beam and the beam current notch is measured.