Defect identification by means of electric field gradient calculation

The electric field gradients (EFG) caused by group V acceptors, group Ib acceptors and the Cd vacancy in CdTe are calculated using the linearised augmented plane wave method and compared to the corresponding experimental values. Experimentally, the EFG are determined by the perturbed gamma gamma -an...

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Detalles Bibliográficos
Autores principales: Lany, S, Ostheimer, V, Wolf, H, Wichert, T
Lenguaje:eng
Publicado: 2001
Materias:
Condensed Matter
Acceso en línea:https://dx.doi.org/10.1016/S0921-4526(01)00853-5
http://cds.cern.ch/record/560277
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author Lany, S
Ostheimer, V
Wolf, H
Wichert, T
author_facet Lany, S
Ostheimer, V
Wolf, H
Wichert, T
author_sort Lany, S
collection CERN
description The electric field gradients (EFG) caused by group V acceptors, group Ib acceptors and the Cd vacancy in CdTe are calculated using the linearised augmented plane wave method and compared to the corresponding experimental values. Experimentally, the EFG are determined by the perturbed gamma gamma -angular correlation spectroscopy with the radioactive probe isotopes /sup 111/In and /sup 77/Br. Besides the chemical nature, information about the charge state and the lattice relaxation associated with each defect is obtained. (13 refs).
id cern-560277
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2001
record_format invenio
spelling cern-5602772019-09-30T06:29:59Zdoi:10.1016/S0921-4526(01)00853-5http://cds.cern.ch/record/560277engLany, SOstheimer, VWolf, HWichert, TDefect identification by means of electric field gradient calculationCondensed MatterThe electric field gradients (EFG) caused by group V acceptors, group Ib acceptors and the Cd vacancy in CdTe are calculated using the linearised augmented plane wave method and compared to the corresponding experimental values. Experimentally, the EFG are determined by the perturbed gamma gamma -angular correlation spectroscopy with the radioactive probe isotopes /sup 111/In and /sup 77/Br. Besides the chemical nature, information about the charge state and the lattice relaxation associated with each defect is obtained. (13 refs).oai:cds.cern.ch:5602772001
spellingShingle Condensed Matter
Lany, S
Ostheimer, V
Wolf, H
Wichert, T
Defect identification by means of electric field gradient calculation
title Defect identification by means of electric field gradient calculation
title_full Defect identification by means of electric field gradient calculation
title_fullStr Defect identification by means of electric field gradient calculation
title_full_unstemmed Defect identification by means of electric field gradient calculation
title_short Defect identification by means of electric field gradient calculation
title_sort defect identification by means of electric field gradient calculation
topic Condensed Matter
url https://dx.doi.org/10.1016/S0921-4526(01)00853-5
http://cds.cern.ch/record/560277
work_keys_str_mv AT lanys defectidentificationbymeansofelectricfieldgradientcalculation
AT ostheimerv defectidentificationbymeansofelectricfieldgradientcalculation
AT wolfh defectidentificationbymeansofelectricfieldgradientcalculation
AT wichertt defectidentificationbymeansofelectricfieldgradientcalculation

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