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Defect identification by means of electric field gradient calculation

The electric field gradients (EFG) caused by group V acceptors, group Ib acceptors and the Cd vacancy in CdTe are calculated using the linearised augmented plane wave method and compared to the corresponding experimental values. Experimentally, the EFG are determined by the perturbed gamma gamma -an...

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Detalles Bibliográficos
Autores principales:	Lany, S, Ostheimer, V, Wolf, H, Wichert, T
Lenguaje:	eng
Publicado:	2001
Materias:	Condensed Matter
Acceso en línea:	https://dx.doi.org/10.1016/S0921-4526(01)00853-5 http://cds.cern.ch/record/560277

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