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Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures

This study presents the results on the modeling of the electric field distribution, which is controlled by injection and trapping of non- equilibrium carriers, in Si detectors irradiated by high neutron fluences. Analytical calculation of the electric field distribution in detectors irradiated by ne...

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Detalles Bibliográficos
Autores principales: Eremin, V V, Li, Z, Verbitskaya, E
Lenguaje:eng
Publicado: 2002
Materias:
Acceso en línea:https://dx.doi.org/10.1109/TNS.2002.998650
http://cds.cern.ch/record/560378
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author Eremin, V V
Li, Z
Verbitskaya, E
author_facet Eremin, V V
Li, Z
Verbitskaya, E
author_sort Eremin, V V
collection CERN
description This study presents the results on the modeling of the electric field distribution, which is controlled by injection and trapping of non- equilibrium carriers, in Si detectors irradiated by high neutron fluences. Analytical calculation of the electric field distribution in detectors irradiated by neutron fluences of H-10**1**4 to 5-10**1**5 cm**-**2 has been performed, which shows possibility of full depletion voltage reduction at low operational temperatures with hole injection. All calculations are focused on the improvement of charge collection efficiency and prediction for detector behavior in LHC experiments. Comparison of the results of calculations to the experimental data published earlier shows a good qualitative agreement. 10 Refs.
id cern-560378
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2002
record_format invenio
spelling cern-5603782019-09-30T06:29:59Zdoi:10.1109/TNS.2002.998650http://cds.cern.ch/record/560378engEremin, V VLi, ZVerbitskaya, EOptimization of electric field distribution by free carrier injection in silicon detectors operated at low temperaturesHealth Physics and Radiation EffectsDetectors and Experimental TechniquesThis study presents the results on the modeling of the electric field distribution, which is controlled by injection and trapping of non- equilibrium carriers, in Si detectors irradiated by high neutron fluences. Analytical calculation of the electric field distribution in detectors irradiated by neutron fluences of H-10**1**4 to 5-10**1**5 cm**-**2 has been performed, which shows possibility of full depletion voltage reduction at low operational temperatures with hole injection. All calculations are focused on the improvement of charge collection efficiency and prediction for detector behavior in LHC experiments. Comparison of the results of calculations to the experimental data published earlier shows a good qualitative agreement. 10 Refs.oai:cds.cern.ch:5603782002
spellingShingle Health Physics and Radiation Effects
Detectors and Experimental Techniques
Eremin, V V
Li, Z
Verbitskaya, E
Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
title Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
title_full Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
title_fullStr Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
title_full_unstemmed Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
title_short Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
title_sort optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures
topic Health Physics and Radiation Effects
Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/TNS.2002.998650
http://cds.cern.ch/record/560378
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AT liz optimizationofelectricfielddistributionbyfreecarrierinjectioninsilicondetectorsoperatedatlowtemperatures
AT verbitskayae optimizationofelectricfielddistributionbyfreecarrierinjectioninsilicondetectorsoperatedatlowtemperatures