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Anomalous X-Ray scattering for materials characterization: atomic-scale structure determination

Detalles Bibliográficos
Autor principal:	Havenith, Martina
Lenguaje:	eng
Publicado:	Springer 2002
Materias:	Nuclear Physics
Acceso en línea:	https://dx.doi.org/10.1007/3-540-46008-X http://cds.cern.ch/record/580943

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