Cargando…
Precision measurement of charged kaon decay parameters with an extended NA48 setup
A high statistics study of charged kaon decays is proposed using a novel design for simultaneous $K^+/K^-$ beams, and NA48 setup upgraded with a transition radiation detector. The main goal is to measure CP-violating asymmetry in $K^{\pm}\rightarrow \pi^+ \pi^- \pi^{\pm}$ decays with an accuracy of...
Autores principales: | , |
---|---|
Lenguaje: | eng |
Publicado: |
2002
|
Acceso en línea: | http://cds.cern.ch/record/5845 |
_version_ | 1780872564410679296 |
---|---|
author | Gatignon, L Ceccucci, A |
author_facet | Gatignon, L Ceccucci, A |
author_sort | Gatignon, L |
collection | CERN |
description | A high statistics study of charged kaon decays is proposed using a novel design for simultaneous $K^+/K^-$ beams, and NA48 setup upgraded with a transition radiation detector. The main goal is to measure CP-violating asymmetry in $K^{\pm}\rightarrow \pi^+ \pi^- \pi^{\pm}$ decays with an accuracy of $2.2 \times 10^{-4}$. In addition CP-violating asymmetry will be measured in $K^{\pm}\rightarrow \pi^0 \pi^0 \pi^{\pm}$ decays, more than $10^6$ of $K_{e4}$ decays will be accumulated which allow to measure a scattering length parameter $a^0_0$ with an accuracy better than 0.01, and some other rare decays will be studied as well. |
id | cern-5845 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2002 |
record_format | invenio |
spelling | cern-58452020-11-19T09:52:17Zhttp://cds.cern.ch/record/5845engGatignon, LCeccucci, APrecision measurement of charged kaon decay parameters with an extended NA48 setupA high statistics study of charged kaon decays is proposed using a novel design for simultaneous $K^+/K^-$ beams, and NA48 setup upgraded with a transition radiation detector. The main goal is to measure CP-violating asymmetry in $K^{\pm}\rightarrow \pi^+ \pi^- \pi^{\pm}$ decays with an accuracy of $2.2 \times 10^{-4}$. In addition CP-violating asymmetry will be measured in $K^{\pm}\rightarrow \pi^0 \pi^0 \pi^{\pm}$ decays, more than $10^6$ of $K_{e4}$ decays will be accumulated which allow to measure a scattering length parameter $a^0_0$ with an accuracy better than 0.01, and some other rare decays will be studied as well.oai:cds.cern.ch:58452002 |
spellingShingle | Gatignon, L Ceccucci, A Precision measurement of charged kaon decay parameters with an extended NA48 setup |
title | Precision measurement of charged kaon decay parameters with an extended NA48 setup |
title_full | Precision measurement of charged kaon decay parameters with an extended NA48 setup |
title_fullStr | Precision measurement of charged kaon decay parameters with an extended NA48 setup |
title_full_unstemmed | Precision measurement of charged kaon decay parameters with an extended NA48 setup |
title_short | Precision measurement of charged kaon decay parameters with an extended NA48 setup |
title_sort | precision measurement of charged kaon decay parameters with an extended na48 setup |
url | http://cds.cern.ch/record/5845 |
work_keys_str_mv | AT gatignonl precisionmeasurementofchargedkaondecayparameterswithanextendedna48setup AT ceccuccia precisionmeasurementofchargedkaondecayparameterswithanextendedna48setup |