Cargando…
Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
CERN
2002
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2002-003.9 http://cds.cern.ch/record/592711 |
| _version_ | 1780899700446068736 |
|---|---|
| author | Jarron, Pierre |
| author_facet | Jarron, Pierre |
| author_sort | Jarron, Pierre |
| collection | CERN |
| id | cern-592711 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2002 |
| publisher | CERN |
| record_format | invenio |
| spelling | cern-5927112019-09-30T06:29:59Zdoi:10.5170/CERN-2002-003.9http://cds.cern.ch/record/592711engJarron, PierreTrends in microelectronics and nanoeletronics and their impact of HEP instrumentationDetectors and Experimental TechniquesCERNoai:cds.cern.ch:5927112002 |
| spellingShingle | Detectors and Experimental Techniques Jarron, Pierre Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation |
| title | Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation |
| title_full | Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation |
| title_fullStr | Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation |
| title_full_unstemmed | Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation |
| title_short | Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation |
| title_sort | trends in microelectronics and nanoeletronics and their impact of hep instrumentation |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.5170/CERN-2002-003.9 http://cds.cern.ch/record/592711 |
| work_keys_str_mv | AT jarronpierre trendsinmicroelectronicsandnanoeletronicsandtheirimpactofhepinstrumentation |