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Trends in microelectronics and nanoeletronics and their impact of HEP instrumentation
Autor principal: | Jarron, Pierre |
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Lenguaje: | eng |
Publicado: |
CERN
2002
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.5170/CERN-2002-003.9 http://cds.cern.ch/record/592711 |
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