Cargando…

Single event effects measurements on the electronics for the CMS muon barrel detector at LHC

Several irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on...

Descripción completa

Detalles Bibliográficos
Autores principales: Agosteo, S, Castellani, L, D'Angelo, G, Dal Corso, F, Dallavalle, G M, De Giorgi, M, Fernández, C, Gonella, F, Lippi, I, Marin, J, Martinelli, R, Montanari, A, Odorici, F, Oller, J C, Pegoraro, M
Lenguaje:eng
Publicado: 2002
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(02)00791-X
http://cds.cern.ch/record/597176
_version_ 1780899895446601728
author Agosteo, S
Castellani, L
D'Angelo, G
Dal Corso, F
Dallavalle, G M
De Giorgi, M
Fernández, C
Gonella, F
Lippi, I
Marin, J
Martinelli, R
Montanari, A
Odorici, F
Oller, J C
Pegoraro, M
author_facet Agosteo, S
Castellani, L
D'Angelo, G
Dal Corso, F
Dallavalle, G M
De Giorgi, M
Fernández, C
Gonella, F
Lippi, I
Marin, J
Martinelli, R
Montanari, A
Odorici, F
Oller, J C
Pegoraro, M
author_sort Agosteo, S
collection CERN
description Several irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on front-end electronics and destructive effects on the High-voltage distribution electronics were observed. Overcurrent protection and error correction circuits were included in the irradiated boards and were tested.
id cern-597176
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2002
record_format invenio
spelling cern-5971762019-09-30T06:29:59Zdoi:10.1016/S0168-9002(02)00791-Xhttp://cds.cern.ch/record/597176engAgosteo, SCastellani, LD'Angelo, GDal Corso, FDallavalle, G MDe Giorgi, MFernández, CGonella, FLippi, IMarin, JMartinelli, RMontanari, AOdorici, FOller, J CPegoraro, MSingle event effects measurements on the electronics for the CMS muon barrel detector at LHCDetectors and Experimental TechniquesSeveral irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on front-end electronics and destructive effects on the High-voltage distribution electronics were observed. Overcurrent protection and error correction circuits were included in the irradiated boards and were tested.oai:cds.cern.ch:5971762002
spellingShingle Detectors and Experimental Techniques
Agosteo, S
Castellani, L
D'Angelo, G
Dal Corso, F
Dallavalle, G M
De Giorgi, M
Fernández, C
Gonella, F
Lippi, I
Marin, J
Martinelli, R
Montanari, A
Odorici, F
Oller, J C
Pegoraro, M
Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
title Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
title_full Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
title_fullStr Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
title_full_unstemmed Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
title_short Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
title_sort single event effects measurements on the electronics for the cms muon barrel detector at lhc
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(02)00791-X
http://cds.cern.ch/record/597176
work_keys_str_mv AT agosteos singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT castellanil singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT dangelog singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT dalcorsof singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT dallavallegm singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT degiorgim singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT fernandezc singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT gonellaf singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT lippii singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT marinj singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT martinellir singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT montanaria singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT odoricif singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT ollerjc singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc
AT pegorarom singleeventeffectsmeasurementsontheelectronicsforthecmsmuonbarreldetectoratlhc