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Single event effects measurements on the electronics for the CMS muon barrel detector at LHC
Several irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on...
Autores principales: | , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2002
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(02)00791-X http://cds.cern.ch/record/597176 |
_version_ | 1780899895446601728 |
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author | Agosteo, S Castellani, L D'Angelo, G Dal Corso, F Dallavalle, G M De Giorgi, M Fernández, C Gonella, F Lippi, I Marin, J Martinelli, R Montanari, A Odorici, F Oller, J C Pegoraro, M |
author_facet | Agosteo, S Castellani, L D'Angelo, G Dal Corso, F Dallavalle, G M De Giorgi, M Fernández, C Gonella, F Lippi, I Marin, J Martinelli, R Montanari, A Odorici, F Oller, J C Pegoraro, M |
author_sort | Agosteo, S |
collection | CERN |
description | Several irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on front-end electronics and destructive effects on the High-voltage distribution electronics were observed. Overcurrent protection and error correction circuits were included in the irradiated boards and were tested. |
id | cern-597176 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2002 |
record_format | invenio |
spelling | cern-5971762019-09-30T06:29:59Zdoi:10.1016/S0168-9002(02)00791-Xhttp://cds.cern.ch/record/597176engAgosteo, SCastellani, LD'Angelo, GDal Corso, FDallavalle, G MDe Giorgi, MFernández, CGonella, FLippi, IMarin, JMartinelli, RMontanari, AOdorici, FOller, J CPegoraro, MSingle event effects measurements on the electronics for the CMS muon barrel detector at LHCDetectors and Experimental TechniquesSeveral irradiation tests of the electronics of the CMS barrel muon detector were performed using neutrons, protons and heavy ions. The Single Event Upset rate on some tested devices was measured, while upper limits were obtained for devices having experienced no failure. Single Event Transients on front-end electronics and destructive effects on the High-voltage distribution electronics were observed. Overcurrent protection and error correction circuits were included in the irradiated boards and were tested.oai:cds.cern.ch:5971762002 |
spellingShingle | Detectors and Experimental Techniques Agosteo, S Castellani, L D'Angelo, G Dal Corso, F Dallavalle, G M De Giorgi, M Fernández, C Gonella, F Lippi, I Marin, J Martinelli, R Montanari, A Odorici, F Oller, J C Pegoraro, M Single event effects measurements on the electronics for the CMS muon barrel detector at LHC |
title | Single event effects measurements on the electronics for the CMS muon barrel detector at LHC |
title_full | Single event effects measurements on the electronics for the CMS muon barrel detector at LHC |
title_fullStr | Single event effects measurements on the electronics for the CMS muon barrel detector at LHC |
title_full_unstemmed | Single event effects measurements on the electronics for the CMS muon barrel detector at LHC |
title_short | Single event effects measurements on the electronics for the CMS muon barrel detector at LHC |
title_sort | single event effects measurements on the electronics for the cms muon barrel detector at lhc |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1016/S0168-9002(02)00791-X http://cds.cern.ch/record/597176 |
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