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Ion-induced desorption yield measurements from copper and aluminium
Ion-stimulated desorption yields of pure aluminium and OFHC copper samples, materials of high technological interest, have been measured in an ultra-high vacuum system both unbaked and after 24h baking at 200 degree C. Measurements for both materials were performed using incident ions of argon at en...
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| Lenguaje: | eng |
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2002
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| Acceso en línea: | https://dx.doi.org/10.1016/S0042-207X(02)00223-3 http://cds.cern.ch/record/609057 |