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6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
2004
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/612499 |
_version_ | 1780900225780547584 |
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author | Civinini, Carlo Focardi, Ettore |
author_facet | Civinini, Carlo Focardi, Ettore |
author_sort | Civinini, Carlo |
collection | CERN |
id | cern-612499 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2004 |
record_format | invenio |
spelling | cern-6124992021-07-30T13:18:37Z http://cds.cern.ch/record/612499 eng Civinini, Carlo Focardi, Ettore 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Detectors and Experimental Techniques 2004 |
spellingShingle | Detectors and Experimental Techniques Civinini, Carlo Focardi, Ettore 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title | 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_full | 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_fullStr | 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_full_unstemmed | 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_short | 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_sort | 6th international conference on large scale applications and radiation hardness of semiconductor detectors |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/612499 |
work_keys_str_mv | AT civininicarlo 6thinternationalconferenceonlargescaleapplicationsandradiationhardnessofsemiconductordetectors AT focardiettore 6thinternationalconferenceonlargescaleapplicationsandradiationhardnessofsemiconductordetectors |