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Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker

Studies have been performed on the radiation hardness of the type of VCSELs**2 Vertical Cavity Surface Emitting Lasers. that will be used in the ATLAS SemicConductor Tracker. The measurements were made using 30 MeV proton beams, 24 GeV/c proton beams and a gamma source. The lifetime of the devices a...

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Detalles Bibliográficos
Autores principales: Teng, P K, Weidberg, T, Chu, M L, Duh, T S, Gregor, I M, Hou, L S, Lee, S C, Song, P S, Su, D S
Lenguaje:eng
Publicado: 2003
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(02)01922-8
http://cds.cern.ch/record/623641
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author Teng, P K
Weidberg, T
Chu, M L
Duh, T S
Gregor, I M
Hou, L S
Lee, S C
Song, P S
Su, D S
author_facet Teng, P K
Weidberg, T
Chu, M L
Duh, T S
Gregor, I M
Hou, L S
Lee, S C
Song, P S
Su, D S
author_sort Teng, P K
collection CERN
description Studies have been performed on the radiation hardness of the type of VCSELs**2 Vertical Cavity Surface Emitting Lasers. that will be used in the ATLAS SemicConductor Tracker. The measurements were made using 30 MeV proton beams, 24 GeV/c proton beams and a gamma source. The lifetime of the devices after irradiation was studied.
id cern-623641
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2003
record_format invenio
spelling cern-6236412019-09-30T06:29:59Zdoi:10.1016/S0168-9002(02)01922-8http://cds.cern.ch/record/623641engTeng, P KWeidberg, TChu, M LDuh, T SGregor, I MHou, L SLee, S CSong, P SSu, D SRadiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor TrackerDetectors and Experimental TechniquesStudies have been performed on the radiation hardness of the type of VCSELs**2 Vertical Cavity Surface Emitting Lasers. that will be used in the ATLAS SemicConductor Tracker. The measurements were made using 30 MeV proton beams, 24 GeV/c proton beams and a gamma source. The lifetime of the devices after irradiation was studied.oai:cds.cern.ch:6236412003
spellingShingle Detectors and Experimental Techniques
Teng, P K
Weidberg, T
Chu, M L
Duh, T S
Gregor, I M
Hou, L S
Lee, S C
Song, P S
Su, D S
Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker
title Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker
title_full Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker
title_fullStr Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker
title_full_unstemmed Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker
title_short Radiation hardness and lifetime studies of the VCSELs for the ATLAS SemiConductor Tracker
title_sort radiation hardness and lifetime studies of the vcsels for the atlas semiconductor tracker
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(02)01922-8
http://cds.cern.ch/record/623641
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