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X-Ray Tomography for the ATLAS Semi-Conductor Tracker
Results are presented of methodical investigations of an X-ray tomography system for positioning silicon strip modules. The achieved efficiency and a measured accuracy of better than 5 $\mu$m is sufficient for using this method in a high precision survey of the ATLAS inner tracker.
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
1998
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/683710 |
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