TEST ON ABCD CHIPS

The ABCD chip is one of the two technological options for the binary readout architecture under development for the Silicon Tracker (SCT) in ATLAS. The chip is realised in the DMILL technology (a 0.8 mum BICMOS trench isolation process). This note reports on the first results obtained at CERN on the...

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Detalles Bibliográficos
Autores principales: Ferrère, D, Macina, Daniela, Zsenei, A, Kaplon, J, Lacasta, C, Dabrowski, W, Kudlaty, J, Wolter, M, Azman, S
Lenguaje:eng
Publicado: 1998
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/683754
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author Ferrère, D
Macina, Daniela
Zsenei, A
Kaplon, J
Lacasta, C
Dabrowski, W
Kudlaty, J
Wolter, M
Azman, S
author_facet Ferrère, D
Macina, Daniela
Zsenei, A
Kaplon, J
Lacasta, C
Dabrowski, W
Kudlaty, J
Wolter, M
Azman, S
author_sort Ferrère, D
collection CERN
description The ABCD chip is one of the two technological options for the binary readout architecture under development for the Silicon Tracker (SCT) in ATLAS. The chip is realised in the DMILL technology (a 0.8 mum BICMOS trench isolation process). This note reports on the first results obtained at CERN on the p-type ABCD chips of the first batch delivered by TEMIC in February 1998.
id cern-683754
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1998
record_format invenio
spelling cern-6837542019-09-30T06:29:59Zhttp://cds.cern.ch/record/683754engFerrère, DMacina, DanielaZsenei, AKaplon, JLacasta, CDabrowski, WKudlaty, JWolter, MAzman, STEST ON ABCD CHIPSDetectors and Experimental TechniquesThe ABCD chip is one of the two technological options for the binary readout architecture under development for the Silicon Tracker (SCT) in ATLAS. The chip is realised in the DMILL technology (a 0.8 mum BICMOS trench isolation process). This note reports on the first results obtained at CERN on the p-type ABCD chips of the first batch delivered by TEMIC in February 1998.ATL-INDET-98-217oai:cds.cern.ch:6837541998-11-17
spellingShingle Detectors and Experimental Techniques
Ferrère, D
Macina, Daniela
Zsenei, A
Kaplon, J
Lacasta, C
Dabrowski, W
Kudlaty, J
Wolter, M
Azman, S
TEST ON ABCD CHIPS
title TEST ON ABCD CHIPS
title_full TEST ON ABCD CHIPS
title_fullStr TEST ON ABCD CHIPS
title_full_unstemmed TEST ON ABCD CHIPS
title_short TEST ON ABCD CHIPS
title_sort test on abcd chips
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/683754
work_keys_str_mv AT ferrered testonabcdchips
AT macinadaniela testonabcdchips
AT zseneia testonabcdchips
AT kaplonj testonabcdchips
AT lacastac testonabcdchips
AT dabrowskiw testonabcdchips
AT kudlatyj testonabcdchips
AT wolterm testonabcdchips
AT azmans testonabcdchips

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