Cargando…
Total Ionizing Dose Effects in a Xilinx FPGA
We have measured the effects of total ionizing dose on three Xilinx XC4036XL FPGAs. The FPGAs were irradiated at a dose rate of 0.5 krad/hr. An average total dose of (41+-1) krad(Si) was absorbed before the power supply current began to increase and (60+-4) krad(Si) was absorbed before the first err...
| Autores principales: | , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
1999
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/683789 |