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Total Ionizing Dose Effects in a Xilinx FPGA

We have measured the effects of total ionizing dose on three Xilinx XC4036XL FPGAs. The FPGAs were irradiated at a dose rate of 0.5 krad/hr. An average total dose of (41+-1) krad(Si) was absorbed before the power supply current began to increase and (60+-4) krad(Si) was absorbed before the first err...

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Detalles Bibliográficos
Autores principales:	Buchanan, N J, Gingrich, D M, Green, PW, MacQueen, D M
Lenguaje:	eng
Publicado:	1999
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/683789

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